• DocumentCode
    3437179
  • Title

    A method for topology conformance tests under logical constraints

  • Author

    Zhang, Jianwu ; Xu, Guoai ; Yang, Yixian ; Guo, Shize

  • Author_Institution
    Nat. Eng. Lab. for Disaster Backup & Recovery, Beijing Univ. of Posts & Telecommun., Beijing, China
  • fYear
    2010
  • fDate
    25-27 June 2010
  • Firstpage
    386
  • Lastpage
    390
  • Abstract
    Common Criteria(CC) provides only the standard for evaluating information security product or system. Conformance test is considered from a statistical point of view, while the determination of whether the topology is consistent with the standard depends on a conformance test. CC based topology conformance test is in trouble without an effective method. In this paper, a method for topology conformance test was presented and an algorithm for topology conformance test under logical constraints was introduced. In our method, the topology is described by a matrix and the logical constraints are stored using Binary Decision Diagrams (BDDs) data structure. From the experimental results, we can see the method is efficient enough for topology conformance test.
  • Keywords
    Boolean functions; Circuit testing; Data structures; Electronic mail; Information security; Laboratories; Logic testing; Protection; System testing; Telecommunication network topology; logical constrants; topology; topology conformance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications, Networking and Information Security (WCNIS), 2010 IEEE International Conference on
  • Conference_Location
    Beijing, China
  • Print_ISBN
    978-1-4244-5850-9
  • Type

    conf

  • DOI
    10.1109/WCINS.2010.5541805
  • Filename
    5541805