DocumentCode :
3437189
Title :
Multi-tone EMC testing strategy for RF-devices
Author :
Biondi, A. ; Rogier, Hendrik ; Vande Ginste, Dries ; De Zutter, Daniel
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
fYear :
2012
fDate :
9-11 Dec. 2012
Firstpage :
89
Lastpage :
92
Abstract :
In low-cost miniaturized electronic systems, filters are often omitted in front of active non-linear components, potentially resulting in unwanted intermodulation products in the band of operation. Current immunity tests most often use a single-frequency source and are hence not able to capture all relevant intermodulation products. Relying on an anechoic chamber as test facility and using multiple-tone excitation from a dual-source network analyzer, we present an advanced test methodology to evaluate in-the-band leakage of out-of-band undesired frequencies. To demonstrate our approach we use a frequency-selective active textile antenna with integrated non-linear low-noise amplifier.
Keywords :
electromagnetic compatibility; low noise amplifiers; network analysers; RF-devices; active nonlinear components; anechoic chamber; current immunity tests; dual-source network analyzer; frequency-selective active textile antenna; in-the-band leakage; integrated nonlinear low-noise amplifier; low-cost miniaturized electronic systems; multitone EMC testing strategy; out-of-band undesired frequencies; single-frequency source; unwanted intermodulation products; Antennas; Electromagnetic compatibility; Gain; Intermodulation distortion; Lighting; Testing; Textiles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2012 IEEE
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-1444-2
Electronic_ISBN :
978-1-4673-1445-9
Type :
conf
DOI :
10.1109/EDAPS.2012.6469385
Filename :
6469385
Link To Document :
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