DocumentCode :
3437207
Title :
Packaging and qualification of MEMS-based space systems
Author :
Muller ; Hecht, M.H. ; Miller, L.M. ; Rockstad, H.K. ; Lyke, J.C.
Author_Institution :
Center for Space Microelectronics Technol., California Inst. of Technol., Pasadena, CA, USA
fYear :
1996
fDate :
11-15 Feb 1996
Firstpage :
503
Lastpage :
508
Abstract :
The number of spacecraft designed and built over the next century will grow exponentially as communication satellite networks proliferate and NASA continues to push towards the development of many microspacecraft to replace its traditional “grand tour” space vehicles. Costs in the space industry are measured in terms of weight (dollars per pound launched) and reliability. Unit costs pale in comparison to launch costs and the cost of replacing an entire vehicle in the case of a catastrophic failure. Space systems present a unique application for microelectromechanical systems (MEMS) technology which can be applied to miniaturize many of the subsystems in a space vehicle, and can improve overall reliability. This paper identifies potential applications of MEMS in a space system, describes space environmental factors, and reviews efforts to develop appropriate packaging and space qualification methodologies. Finally, a flight experiment for testing the performance of typical MEMS devices and packages in the space environment is described
Keywords :
economics; environmental factors; micromechanical devices; semiconductor device manufacture; semiconductor device packaging; semiconductor device reliability; space vehicle electronics; MEMS; NASA; catastrophic failure; communication satellite networks; environmental factors; flight experiment; launch costs; microelectromechanical systems; microspacecraft; packaging; performance; reliability; space industry; space qualification; space systems; spacecraft; unit costs; weight; Aerospace industry; Artificial satellites; Costs; Micromechanical devices; NASA; Packaging; Qualifications; Space technology; Space vehicles; Telecommunication network reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1996, MEMS '96, Proceedings. An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems. IEEE, The Ninth Annual International Workshop on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-2985-6
Type :
conf
DOI :
10.1109/MEMSYS.1996.494033
Filename :
494033
Link To Document :
بازگشت