DocumentCode :
3437398
Title :
Handling Class Overlap and Imbalance to Detect Prompt Situations in Smart Homes
Author :
Das, Biswajit ; Krishnan, Narayanan C. ; Cook, Diane J.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
fYear :
2013
fDate :
7-10 Dec. 2013
Firstpage :
266
Lastpage :
273
Abstract :
The class imbalance problem is a well-known classification challenge in machine learning that has vexed researchers for over a decade. Under-representation of one or more of the target classes (minority class(es)) as compared to others (majority class(es)) can restrict the application of conventional classifiers directly on the data. In addition, emerging challenges such as overlapping classes, make class imbalance even harder to solve. Class overlap is caused due to ambiguous regions in the data where the prior probability of two or more classes are approximately equal. We are motivated to address the challenge of class overlap in the presence of imbalanced classes by a problem in pervasive computing. Specifically, we are designing smart environments that perform health monitoring and assistance. Our solution, ClusBUS, is a clustering-based under sampling technique that identifies data regions where minority class samples are embedded deep inside majority class. By removing majority class samples from these regions, ClusBUS preprocesses the data in order to give more importance to the minority class during classification. Experiments show that ClusBUS achieves improved performance over an existing method for handling class imbalance.
Keywords :
home automation; learning (artificial intelligence); pattern classification; pattern clustering; ubiquitous computing; ClusBUS; class imbalance; class overlap; classification challenge; clustering-based undersampling technique; health monitoring; machine learning; pervasive computing; prompt situation detection; smart environments; smart homes; Accuracy; Clustering algorithms; Machine learning algorithms; Monitoring; Noise; Smart homes; Support vector machines; Class imbalance; automated prompting; overlapping classes; sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining Workshops (ICDMW), 2013 IEEE 13th International Conference on
Conference_Location :
Dallas, TX
Print_ISBN :
978-1-4799-3143-9
Type :
conf
DOI :
10.1109/ICDMW.2013.18
Filename :
6753930
Link To Document :
بازگشت