• DocumentCode
    3437425
  • Title

    Computer-aided simulation of optical interconnects for high-speed digital systems

  • Author

    Yang, A.T. ; Gao, D.S. ; Kang, S.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1988
  • fDate
    3-5 Oct 1988
  • Firstpage
    87
  • Lastpage
    90
  • Abstract
    The authors discuss optical interconnects, with emphasis on computer-aided modeling and simulation of optoelectronic integrated circuits (OEIC). Results are presented on laser diodes driven by GaAs MODFET driver circuits, optical waveguides, photodetectors and MODFET amplifiers to drive digital GaAs circuits. The models have been verified using iSMILE a CAD tool for OEIC. The speed advantage of optical interconnects over the conventional metallic interconnects has been projected in terms of the routing distance and the fanout count. The optical interconnect is clearly superior for long distance and for high fanouts. For short distance and low fanouts, it can also become superior when very-low-power laser diodes and more efficient photodetectors become available
  • Keywords
    VLSI; circuit CAD; circuit analysis computing; gallium arsenide; high electron mobility transistors; integrated optoelectronics; optical interconnections; GaAs; GaAs MODFET driver circuits; GaAs multiple-quantum-well laser model; MODFET amplifiers; computer-aided modeling; digital GaAs circuits; fanout count; high-speed digital systems; iSMILE; laser diodes; optical interconnects; optical waveguides; optoelectronic integrated circuits; photodetectors; routing distance; Computational modeling; Computer simulation; Diode lasers; Gallium arsenide; Integrated circuit modeling; MODFET circuits; MODFET integrated circuits; Optical computing; Optical interconnections; Optoelectronic devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1988. ICCD '88., Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Rye Brook, NY
  • Print_ISBN
    0-8186-0872-2
  • Type

    conf

  • DOI
    10.1109/ICCD.1988.25665
  • Filename
    25665