• DocumentCode
    343754
  • Title

    The effects of substrate permittivity and pulse-width on the crosstalk as applied to ultra-high-speed microstrip lines

  • Author

    Ungvichian, V. ; Malisuwan, S.

  • Author_Institution
    Dept. of Electr. Eng., Florida Atlantic Univ., Boca Raton, FL, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    11-16 July 1999
  • Firstpage
    202
  • Abstract
    The crosstalk of parallel microstrip lines is investigated with an emphasis on important parameters such as substrate permittivity (/spl epsiv//sub r/), pulse-width (/spl tau/) and line-length. The technique utilized here is based on the Fourier and linear system theory. Several closed form expressions for the frequency-dependent parameters are included in the simulations. From the simulations using an ideal Gaussian pulse source, the results suggest that for a wider pulse-width (/spl tau/>10 ps) the crosstalk is proportion to /spl epsiv//sub r/, but for very narrow pulses (/spl tau//spl les/10 ps), the crosstalk is either reduced or relatively the same for /spl epsiv//sub r//spl ges/9.7. Also, for a narrow pulse (/spl tau/=5 ps), the crosstalk depicts an oscillatory level along the line. At 30 mm, a 5 ps pulse produces less crosstalk than the 10 ps pulse.
  • Keywords
    Gaussian processes; crosstalk; dielectric losses; microstrip lines; permittivity; waveguide theory; Fourier theory; closed form expressions; crosstalk; dielectric loss; frequency-dependent parameters; ideal Gaussian pulse source; line-length; linear system theory; oscillatory level; parallel microstrip lines; pulse-width; simulations; substrate permittivity; ultra-high-speed microstrip lines; Crosstalk; Dielectric losses; Dielectric substrates; Frequency; Joining processes; Microstrip; Permittivity; Printed circuits; Space vector pulse width modulation; Spectral analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.789116
  • Filename
    789116