Title :
High speed analog signal tester
Author :
Simon, Brent ; Mason, Ralph ; Runtz, Ken
Abstract :
This paper describes a new high speed analog signal testing technique that can be used to characterize high speed analog signals in an integrated circuit (IC). The procedure can be implemented on an IC to be tested with the addition of two simple components. The end result is that high speed analog signals can be sampled and brought off-chip to be stored in some manner. The authors discuss the CMOS4S and BiCMOS analog signal testers
Keywords :
BiCMOS analogue integrated circuits; CMOS analogue integrated circuits; integrated circuit testing; signal sampling; BiCMOS analog signal tester; CMOS4S analog signal tester; high speed analog signal testing technique; high speed analog signals sampling; integrated circuit; Analog integrated circuits; BiCMOS integrated circuits; CMOS integrated circuits; Circuit testing; Frequency measurement; High speed integrated circuits; Integrated circuit testing; Sampling methods; Switches; System testing;
Conference_Titel :
WESCANEX 95. Communications, Power, and Computing. Conference Proceedings., IEEE
Conference_Location :
Winnipeg, Man.
Print_ISBN :
0-7803-2725-X
DOI :
10.1109/WESCAN.1995.494059
