DocumentCode
3437707
Title
High speed analog signal tester
Author
Simon, Brent ; Mason, Ralph ; Runtz, Ken
Volume
2
fYear
1995
fDate
15-16 May 1995
Firstpage
377
Abstract
This paper describes a new high speed analog signal testing technique that can be used to characterize high speed analog signals in an integrated circuit (IC). The procedure can be implemented on an IC to be tested with the addition of two simple components. The end result is that high speed analog signals can be sampled and brought off-chip to be stored in some manner. The authors discuss the CMOS4S and BiCMOS analog signal testers
Keywords
BiCMOS analogue integrated circuits; CMOS analogue integrated circuits; integrated circuit testing; signal sampling; BiCMOS analog signal tester; CMOS4S analog signal tester; high speed analog signal testing technique; high speed analog signals sampling; integrated circuit; Analog integrated circuits; BiCMOS integrated circuits; CMOS integrated circuits; Circuit testing; Frequency measurement; High speed integrated circuits; Integrated circuit testing; Sampling methods; Switches; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
WESCANEX 95. Communications, Power, and Computing. Conference Proceedings., IEEE
Conference_Location
Winnipeg, Man.
Print_ISBN
0-7803-2725-X
Type
conf
DOI
10.1109/WESCAN.1995.494059
Filename
494059
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