Title :
Moving current filaments in ESD protection devices and their relation to electrical characteristics
Author :
Pogany, D. ; Bychikhin, S. ; Gornik, E. ; Denison, M. ; Jensen, N. ; Groos, G. ; Stecher, M.
Author_Institution :
Inst. for Solid State Electron., Tech. Univ. of Vienna, Austria
fDate :
30 March-4 April 2003
Abstract :
Dynamics and "travelling" modes of localized moving current filaments in electrostatic discharge (ESD) protection devices during current stress pulses are investigated using backside interferometric thermal mapping methods. The spatio-temporal evolution of the filament along the device width is related to the time evolution of the voltage waveform and to the IV characteristics of the device.
Keywords :
current distribution; electrostatic discharge; failure analysis; light interferometry; power bipolar transistors; protection; pulse measurement; semiconductor device reliability; semiconductor device testing; thyristors; ESD protection devices; I-V characteristics; SCR device; backside interferometric thermal mapping methods; current stress pulses; electrical characteristics; electrostatic discharge; localized moving current filaments; moving current filaments; power devices; smart power technology ESD protection test structures; spatio-temporal evolution; transmission line pulser; travelling modes; vertical npn transistor; voltage waveform time evolution; Electric variables; Electrostatic discharge; Electrostatic interference; Holography; Optical refraction; Protection; Testing; Thermal stresses; Thyristors; Voltage;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN :
0-7803-7649-8
DOI :
10.1109/RELPHY.2003.1197752
