DocumentCode :
343780
Title :
Antenna gain and scattering measurement using reflective three-antenna method
Author :
Hsin-Chia Lu ; Tah-Hsiung Chu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
1
fYear :
1999
fDate :
11-16 July 1999
Firstpage :
374
Abstract :
A novel method is proposed to combine the concepts of three-antenna method and RCS measurement method to measure the antenna gain and its structural scattering characteristics without involving the reference antenna or polarimetric calibration. In this method, the measurement arrangement including the transmitting and receiving antennas is considered as a two-port network with reference planes at the input port for each antenna as shown. By connecting three different known terminators at the receiving antenna port and measuring the reflection coefficients at the transmitting antenna port, the scattering parameters of this two-port network can be derived. They are shown to be related to the product of two antennas´ gain. Therefore one can follow the three-antenna method to find the gain of each antenna. In addition, the structural scattering characteristics of each antenna can be solved.
Keywords :
S-matrix theory; electromagnetic wave reflection; electromagnetic wave scattering; gain measurement; receiving antennas; transmitting antennas; two-port networks; RCS measurement method; antenna gain measurement; input port; measurement arrangement; receiving antennas; reference planes; reflection coefficients; reflective three-antenna method; scattering measurement; scattering parameters; structural scattering characteristics; terminators; transmitting antennas; two-port network; Antenna measurements; Gain measurement; Impedance measurement; Joining processes; Radar scattering; Receiving antennas; Reflection; Reflector antennas; Scattering parameters; Transmitting antennas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
Type :
conf
DOI :
10.1109/APS.1999.789157
Filename :
789157
Link To Document :
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