• DocumentCode
    3437988
  • Title

    Semiconductor reliability challenges from the fabless company perspective

  • Author

    Kole, Thomas M.

  • Author_Institution
    Sirenza Microdevices, Sunnyvale, CA, USA
  • fYear
    2003
  • fDate
    30 March-4 April 2003
  • Firstpage
    318
  • Lastpage
    319
  • Abstract
    The fabless company environment presents several challenges to establishing a successful reliability program. While there are many differences between a company that manufactures wafers and a fabless company, customers have no differences in their requirements for highly reliable devices. As such, the challenge for the fabless company is to provide high reliability without having direct access to all of the process information. This paper will focus on three topics involving some of the key technical aspects necessary for a successful reliability program. The first issue is correlating junction temperatures between the foundry and the fabless company. The second issue is gauging wafer process sensitivities with respect to standard packaging. The third issue involves tracking changes to the wafer process over time, the effects of the changes, and communication of changes between the fabless company and the wafer foundry. Lastly, a list of specific reliability information commonly requested by fabless companies is presented.
  • Keywords
    integrated circuit manufacture; integrated circuit measurement; integrated circuit packaging; integrated circuit reliability; temperature measurement; fabless company environment; highly reliable devices; junction temperatures; packaging; reliability program; semiconductor reliability challenges; wafer foundry; wafer process changes tracking; wafer process sensitivities; Electric variables measurement; Foundries; Life estimation; Life testing; Liquid crystal devices; Plastic packaging; Semiconductor device manufacture; Semiconductor device reliability; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
  • Print_ISBN
    0-7803-7649-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2003.1197765
  • Filename
    1197765