DocumentCode
3437995
Title
Anti-resonance peak damping of PDN impedance by on-board snubber circuits
Author
Iijima, Y. ; Matsumura, Mieko ; Sudo, Toshio
Author_Institution
Shibaura Inst. of Technol., Tokyo, Japan
fYear
2012
fDate
9-11 Dec. 2012
Firstpage
127
Lastpage
130
Abstract
Simultaneous switching noise (SSN) is a serious design issue to stabilize logic operation and to reduce electromagnetic interference (EMI) in advanced CMOS circuits and systems. Ringing frequency observed in the SSN waveforms is strongly related to the anti-resonance peak frequency of total PDN impedance. In this paper, on-board snubber (RC series circuit) was investigated to improve power supply integrity in a FPGA (Field Programmable Gate Array) board. The on-board snubber circuits was added just at the beneath of the power supply terminals of the FPGA to effectively suppress the anti-resonance peak of the total PDN impedance. Design space to damp the anti-resonance peak was examined. In particular, the values of on-board capacitance and resistance of snubber circuit has been examined by using circuit analysis tool and field solver.
Keywords
CMOS logic circuits; damping; electric impedance; electromagnetic interference; field programmable gate arrays; network analysis; on-board communications; power supplies to apparatus; snubbers; EMI; FPGA board; PDN impedance; SSN waveforms; advanced CMOS circuits; antiresonance peak damping; antiresonance peak frequency; circuit analysis tool; electromagnetic interference; field programmable gate array board; logic operation stabilization; on-board capacitance; on-board resistance; on-board snubber; on-board snubber circuits; power supply integrity; power supply terminals; serious design; simultaneous switching noise; Capacitance; Field programmable gate arrays; Impedance; Integrated circuit modeling; Power supplies; Snubbers; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2012 IEEE
Conference_Location
Taipei
Print_ISBN
978-1-4673-1444-2
Electronic_ISBN
978-1-4673-1445-9
Type
conf
DOI
10.1109/EDAPS.2012.6469429
Filename
6469429
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