DocumentCode
3438262
Title
Chip-package-PCB co-design: Dealing with harmonic desensitization in RF SoC/SiP
Author
Fu-Yi Han ; Wen Zhou Wu ; Lee, Hongseok ; Hsieh, Ting-En ; Tang, Tao ; Nan-Cheng Chen
Author_Institution
Mediatek Inc., Hsinchu, Taiwan
fYear
2012
fDate
9-11 Dec. 2012
Firstpage
113
Lastpage
115
Abstract
A comprehensive study based on chip-package-PCB co-design is presented to deal with the harmonic desensitization issue in RF receivers. To gain insights on the interaction between the chip, interconnects, and harmonic interferences, simplified interconnect models were co-simulated with the crystal oscillator as well as the posterior buffer chain to realize the mutual dependency. It was found that decoupling mechanism and interconnect parasitics will dominate the harmonic leakage from the crystal oscillator chain. By optimizing the decoupling and interconnect parasitics, the desensitization phenomenon can be eliminated completely. This generalized analysis can widely be applied to all kinds of system-on-chip (SoC) / system-in-package (SiP) designs for wireless communication applications, in which interferences and couplings are critical bottlenecks of system integrations.
Keywords
buffer circuits; chip scale packaging; crystal oscillators; integrated circuit interconnections; printed circuit design; radio receivers; radiofrequency integrated circuits; system-in-package; system-on-chip; RF SoC-SiP; RF receivers; chip-package-PCB codesign; crystal oscillator chain; decoupling mechanism; harmonic desensitization; harmonic interferences; harmonic leakage; interconnect models; interconnect parasitics; mutual dependency; posterior buffer chain; simplified interconnect models; system integrations; system-in-package; system-on-chip; wireless communication applications; Capacitors; Couplings; Crystals; Harmonic analysis; Oscillators; Radio frequency; System-on-a-chip; RF desensitization; System-on-chip (SoC); chip-package-PCB co-design; interconnect modelling; interference coupling; system-in-package (SiP);
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2012 IEEE
Conference_Location
Taipei
Print_ISBN
978-1-4673-1444-2
Electronic_ISBN
978-1-4673-1445-9
Type
conf
DOI
10.1109/EDAPS.2012.6469441
Filename
6469441
Link To Document