• DocumentCode
    3438262
  • Title

    Chip-package-PCB co-design: Dealing with harmonic desensitization in RF SoC/SiP

  • Author

    Fu-Yi Han ; Wen Zhou Wu ; Lee, Hongseok ; Hsieh, Ting-En ; Tang, Tao ; Nan-Cheng Chen

  • Author_Institution
    Mediatek Inc., Hsinchu, Taiwan
  • fYear
    2012
  • fDate
    9-11 Dec. 2012
  • Firstpage
    113
  • Lastpage
    115
  • Abstract
    A comprehensive study based on chip-package-PCB co-design is presented to deal with the harmonic desensitization issue in RF receivers. To gain insights on the interaction between the chip, interconnects, and harmonic interferences, simplified interconnect models were co-simulated with the crystal oscillator as well as the posterior buffer chain to realize the mutual dependency. It was found that decoupling mechanism and interconnect parasitics will dominate the harmonic leakage from the crystal oscillator chain. By optimizing the decoupling and interconnect parasitics, the desensitization phenomenon can be eliminated completely. This generalized analysis can widely be applied to all kinds of system-on-chip (SoC) / system-in-package (SiP) designs for wireless communication applications, in which interferences and couplings are critical bottlenecks of system integrations.
  • Keywords
    buffer circuits; chip scale packaging; crystal oscillators; integrated circuit interconnections; printed circuit design; radio receivers; radiofrequency integrated circuits; system-in-package; system-on-chip; RF SoC-SiP; RF receivers; chip-package-PCB codesign; crystal oscillator chain; decoupling mechanism; harmonic desensitization; harmonic interferences; harmonic leakage; interconnect models; interconnect parasitics; mutual dependency; posterior buffer chain; simplified interconnect models; system integrations; system-in-package; system-on-chip; wireless communication applications; Capacitors; Couplings; Crystals; Harmonic analysis; Oscillators; Radio frequency; System-on-a-chip; RF desensitization; System-on-chip (SoC); chip-package-PCB co-design; interconnect modelling; interference coupling; system-in-package (SiP);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2012 IEEE
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4673-1444-2
  • Electronic_ISBN
    978-1-4673-1445-9
  • Type

    conf

  • DOI
    10.1109/EDAPS.2012.6469441
  • Filename
    6469441