DocumentCode :
3438262
Title :
Chip-package-PCB co-design: Dealing with harmonic desensitization in RF SoC/SiP
Author :
Fu-Yi Han ; Wen Zhou Wu ; Lee, Hongseok ; Hsieh, Ting-En ; Tang, Tao ; Nan-Cheng Chen
Author_Institution :
Mediatek Inc., Hsinchu, Taiwan
fYear :
2012
fDate :
9-11 Dec. 2012
Firstpage :
113
Lastpage :
115
Abstract :
A comprehensive study based on chip-package-PCB co-design is presented to deal with the harmonic desensitization issue in RF receivers. To gain insights on the interaction between the chip, interconnects, and harmonic interferences, simplified interconnect models were co-simulated with the crystal oscillator as well as the posterior buffer chain to realize the mutual dependency. It was found that decoupling mechanism and interconnect parasitics will dominate the harmonic leakage from the crystal oscillator chain. By optimizing the decoupling and interconnect parasitics, the desensitization phenomenon can be eliminated completely. This generalized analysis can widely be applied to all kinds of system-on-chip (SoC) / system-in-package (SiP) designs for wireless communication applications, in which interferences and couplings are critical bottlenecks of system integrations.
Keywords :
buffer circuits; chip scale packaging; crystal oscillators; integrated circuit interconnections; printed circuit design; radio receivers; radiofrequency integrated circuits; system-in-package; system-on-chip; RF SoC-SiP; RF receivers; chip-package-PCB codesign; crystal oscillator chain; decoupling mechanism; harmonic desensitization; harmonic interferences; harmonic leakage; interconnect models; interconnect parasitics; mutual dependency; posterior buffer chain; simplified interconnect models; system integrations; system-in-package; system-on-chip; wireless communication applications; Capacitors; Couplings; Crystals; Harmonic analysis; Oscillators; Radio frequency; System-on-a-chip; RF desensitization; System-on-chip (SoC); chip-package-PCB co-design; interconnect modelling; interference coupling; system-in-package (SiP);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2012 IEEE
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-1444-2
Electronic_ISBN :
978-1-4673-1445-9
Type :
conf
DOI :
10.1109/EDAPS.2012.6469441
Filename :
6469441
Link To Document :
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