• DocumentCode
    3438277
  • Title

    Simulation of optical properties of Si wire cells

  • Author

    Altermatt, Pietro P. ; Yang, Yang ; Langer, T. ; Schenk, Andreas ; Brendel, Rolf

  • Author_Institution
    Dep. Solar Energy, Leibniz Univ. of Hannover, Hannover, Germany
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    We solve the Maxwell equations to quantify the amount of photo-generation in Si solar cells consisting of arrays of wires instead of bulk thin-films. Published transmission and reflectance measurements suggest that an array of Si wires absorbs sunlight very effectively due to strong diffraction and scattering. However, a detailed theoretical understanding and quantification of the actual photo-generation is only in its initial stage. In our simulations, the geometrical parameters of the wires are synthesized by means of cluster simulations. Applying the finite element method, we are able to compute randomly aligned wires within manageable time limits and affordable computer capacity. We show that Si wires have strong photonic properties. For example, our simulations surpass the Lambertian limit (for isotropically incident light) at ¿ = 1000 nm, as has been reported in many experiments.
  • Keywords
    Maxwell equations; elemental semiconductors; finite element analysis; semiconductor device measurement; semiconductor device models; silicon; solar cell arrays; Lambertian limit; Maxwell equations; Si; cluster simulations; finite element method; photo-generation; randomly aligned wires; reflectance measurement; solar cells; transmission measurement; wavelength 1000 nm; wire arrays; wire cells; wire geometrical parameters; Computational modeling; Light scattering; Maxwell equations; Optical diffraction; Optical scattering; Photovoltaic cells; Reflectivity; Semiconductor thin films; Solid modeling; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411125
  • Filename
    5411125