DocumentCode :
3438322
Title :
Weibull Analysis of Switching Contact Resistance in Laboratory and Commercial Circuit Breakers
Author :
Leung, Chi H. ; Streicher, Eric ; Fitzgerald, Dennis
Author_Institution :
AMI DODUCO, Export
fYear :
2007
fDate :
16-19 Sept. 2007
Firstpage :
56
Lastpage :
62
Abstract :
Silver/tungsten powder metal electric contacts are used in circuit breakers because of their combination of high conductivity from silver, and high melting temperature from tungsten. In operations of the circuit breaker, switching arcs erode and oxidize the contact surface to create a high resistance layer that can lead to high temperature at the contacts. This arc erosion product is usually a mixture of silver, tungsten, tungsten oxides and silver tungstate. The formation of this layer and its distribution is modified by the metallurgy and electrical parameters. The measurement of the contact resistance depends on the random location of the contact spot and is therefore highly statistical in nature. Weibull distribution is used to analyze switching contact resistance in laboratory switch apparatus and commercial 20A circuit breakers. This is to understand the statistical nature of the measurement and the correlation to the dynamic contact erosion process.
Keywords :
Weibull distribution; circuit breakers; contact resistance; electrical contacts; silver; tungsten; Ag; W; Weibull analysis; Weibull distribution; arc erosion; circuit breakers; contact resistance; current 20 A; dynamic contact erosion process; electrical parameters; laboratory switch apparatus; metallurgy; silver powder metal electric contacts; silver tungstate; tungsten oxides; tungsten powder metal electric contacts; Circuit breakers; Contact resistance; Electrical resistance measurement; Laboratories; Silver; Surface resistance; Switches; Switching circuits; Temperature; Tungsten; UL489; circuit breaker; contact resistance; silver tungsten; temperature rise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical contacts - 2007, the 53rd ieee holm conference on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
1-4244-0837-7
Electronic_ISBN :
1-4244-0838-5
Type :
conf
DOI :
10.1109/HOLM.2007.4318195
Filename :
4318195
Link To Document :
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