• DocumentCode
    3438351
  • Title

    Solving test challenges using modular microwave synthetic test systems

  • Author

    Humphrey, Rick ; Schmitthenner, Tom

  • Author_Institution
    Aeroflex Inc., Powell, OH
  • fYear
    2005
  • fDate
    26-29 Sept. 2005
  • Firstpage
    297
  • Lastpage
    303
  • Abstract
    Recent joint services test demonstration programs require that deliverable systems apply Synthetic Instrumentation (SI). This paper reports on a new generation of microwave SI which will be delivered this calendar year for two demonstration programs. The paper begins with a look at the initiatives of the NxTest group and objectives related to future test equipment programs. We describe the rationale for trends toward ATS implementation using synthetic test concepts. Next, the process and challenges required for mapping multiple legacy system capabilities into requirements for a single synthetic system platform are discussed. A description of the microwave synthetic test subsystem architecture is provided and details of a representative system design are provided to demonstrate how the modularity of a synthetic test platform addresses the requirements. In terms of software, we will explore both the strengths and potential shortcomings with respect to the ambitious objective to run legacy TPSs without modification. Ultimately, success of future programs in applying synthetic technology will be measured by its ability to implement the required testing at competitive capital cost and superior overall tester lifecycle characteristics. We´ll project expectations in terms of these characteristics
  • Keywords
    automatic test equipment; ATS implementation; modular microwave synthetic test systems; multiple legacy system; synthetic instrumentation; test equipment; Automatic testing; Digital signal processing; Hardware; Instruments; Life testing; Microwave devices; Radio frequency; Signal generators; Software measurement; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2005. IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-9101-2
  • Type

    conf

  • DOI
    10.1109/AUTEST.2005.1609147
  • Filename
    1609147