DocumentCode
3438383
Title
Notice of Retraction
A study on Bayesian design of degradation tests with the inverse Gaussian processes
Author
Weiwen Peng ; Hong-Zhong Huang ; Zhonglai Wang ; Yu Liu ; Shun-Peng Zhu
Author_Institution
Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2013
fDate
15-18 July 2013
Firstpage
870
Lastpage
872
Abstract
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Besides the Wiener and Gamma processes, the inverse Gaussian (IG) process is recently proposed as an attractive yet flexible family for degradation modeling. Since degradation test depends heavily on the degradation model chosen for a product´s degradation process, we discuss the optimal design for degradation tests specifically based on the IG process. Other than an optimal design with pre-estimated planning values of model parameters, we handle the situation with uncertainty in the planning values using the Bayesian method. The inspection frequency and measurement numbers are included as design variables. The average pre-posterior variance of reliability is defined as the optimization criterion. An application to the degradation test planning of a GaAs Laser device is used to demonstrate the proposed method.
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Besides the Wiener and Gamma processes, the inverse Gaussian (IG) process is recently proposed as an attractive yet flexible family for degradation modeling. Since degradation test depends heavily on the degradation model chosen for a product´s degradation process, we discuss the optimal design for degradation tests specifically based on the IG process. Other than an optimal design with pre-estimated planning values of model parameters, we handle the situation with uncertainty in the planning values using the Bayesian method. The inspection frequency and measurement numbers are included as design variables. The average pre-posterior variance of reliability is defined as the optimization criterion. An application to the degradation test planning of a GaAs Laser device is used to demonstrate the proposed method.
Keywords
Bayes methods; Gaussian processes; gamma distribution; inspection; life testing; planning; reliability; Bayesian design; Bayesian method; IG process; Wiener process; degradation modeling; degradation test planning; degradation tests; gallium arsenide laser device; gamma process; inspection frequency; inverse Gaussian processes; measurement numbers; model parameters; optimal design; optimization criterion; preestimated planning values; preposterior variance; product degradation process; reliability; Bayes methods; Degradation; Gallium arsenide; Gaussian processes; Planning; Reliability engineering; Bayesian method; degradation test; inverse Gaussian process; optimal design;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4799-1014-4
Type
conf
DOI
10.1109/QR2MSE.2013.6625707
Filename
6625707
Link To Document