• DocumentCode
    3438626
  • Title

    {111} Si Etched Planar Electrical Contacts for Power MEMS-relays

  • Author

    Weber, A.C. ; Lang, J.H. ; Slocum, A.H.

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge
  • fYear
    2007
  • fDate
    16-19 Sept. 2007
  • Firstpage
    156
  • Lastpage
    159
  • Abstract
    We present the design of electrical contacts used in a MEMS-relay for power applications. The device is bulk micromachined in single crystalline silicon and bonded to a glass substrate. Anisotropic etching, using aqueous potassium hydroxide solution, is used to fabricate the oblique, complementary, planar and parallel (111) contact surfaces having nanometer-scale surface roughness. The silicon contact surfaces are evaporated with a conductive film. A thermal oxide layer provides insulation between the silicon substrate and the metal contacts. The contacts are capable of make-break switching resistive and inductive loads. The MEMS device has large contact travel, in the order of 30 mum and low contact resistance, in the order of 120 mOmega. Testing has demonstrated current carrying capacity in the order of 3 A and hot-switching of inductive loads, in the order of 10 mH, without low cycle performance degradation over approximately 30 switching cycles.
  • Keywords
    electrical contacts; microrelays; silicon; Si; anisotropic etching; aqueous potassium hydroxide solution; bulk micromachined; glass substrate; planar electrical contacts; power MEMS-relays; power applications; single crystalline silicon; thermal oxide layer; Anisotropic magnetoresistance; Bonding; Contacts; Crystallization; Etching; Glass; Rough surfaces; Silicon; Substrates; Surface roughness; MEMS-relays; make-break switching; planar contacts; power; si;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical contacts - 2007, the 53rd ieee holm conference on
  • Conference_Location
    Pittsburgh, PA
  • Print_ISBN
    1-4244-0837-7
  • Electronic_ISBN
    1-4244-0838-5
  • Type

    conf

  • DOI
    10.1109/HOLM.2007.4318210
  • Filename
    4318210