Title :
Embedded control/signal processing tools providing improved automated inspection
Author :
Black, Scott ; Goodman, Ronald ; Badman, James
Author_Institution :
Boeing, St. Louis, MO
Abstract :
The manufacturing inspection process for jet engine components, such as fan blades, requires a coordinated real-time control/acquisition system consisting of mechanical/electrical/control/signal processing components. A typical inspection system for composite testing (specifically - Boeing 777) utilizes a combination of mechanical control systems in conjunction with embedded hardware to successfully track, acquire, and analyze the surface dimension and sub-structure composition. Detecting anomalies within the highly contoured structure requires the ability to develop and execute a set of complex signal processing algorithms simultaneous with the real-time control of the mechanical system. The current architecture requires an additional twenty percent of the inspection time to complete the post process. Further complicating the process is the inability to mathematically map the complete part onto a 2-D surface resulting in a multiple segment approach. Though this method has proven successful, the segmented approach increases inspection time and complicates data management
Keywords :
automatic optical inspection; automatic testing; computerised instrumentation; jet engines; mechanical control equipment; signal processing; 2D surface; Boeing 777; automated inspection system; composite testing; control processing components; control/signal processing tools; electrical processing components; embedded hardware; jet engine components; manufacturing inspection process; mechanical control systems; mechanical processing components; multiple segment approach; real-time control system; signal processing algorithms; signal processing components; Automatic control; Blades; Control systems; Inspection; Jet engines; Manufacturing processes; Process control; Real time systems; Signal processing; System testing;
Conference_Titel :
Autotestcon, 2005. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9101-2
DOI :
10.1109/AUTEST.2005.1609163