Notice of RetractionAccelerated validation of product life under a second-tier stress

Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

Small sample size and long-life products´ life assessment has become a hot research topic, since the reduction of sample size and shorten test time can not be achieved at the same time. Therefore, we provide a second-tier accelerated stress method to solve this problem in this paper. First, we combine the first-tier accelerated stress and the maximum entropy test method to cut down the sample size; second, use the second-tier accelerated stress to decrease the test time, and based on these two steps to design an accelerated validation plan. In this paper, we proposed a bogey test and maximum entropy based accelerated life test improvement program.