• DocumentCode
    3438754
  • Title

    Non-uniformities of opto-electronic properties in Cu(In,Ga)Se2 thin films and their influence on cell performance studied with confocal photoluminescence

  • Author

    Gütay, Levent ; Bauer, Gottfried H.

  • Author_Institution
    Lab. for Photovoltaics, Univ. of Luxembourg, Belvaux, Luxembourg
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    We have studied a series of high quality Cu(In,Ga)Se2 thin film solar cells (efficiencies 15% - 18%) with spectrally resolved confocal photoluminescence (PL) which allows for a spatial resolution of ¿ 0.8 ¿m. The recorded PL data were analyzed by application of Planck´s generalized radiation law, which allows for quantification of values for the local splitting of quasi-Fermi levels and of the local threshold energy of optical absorption for each scan-pixel, corresponding to the local open circuit voltage (Voc) in a solar cell and the optical band gap energy of the absorber, respectively. We quantify representative values for spatial variations of these parameters for each cell and discuss qualitatively as well as quantitatively the influence of local inhomogeneities on the resulting total cell quality in terms of Voc and efficiency.
  • Keywords
    Fermi level; copper compounds; energy gap; gallium compounds; indium compounds; optical constants; optoelectronic devices; photoluminescence; semiconductor thin films; solar cells; thin film devices; Cu(InGa)Se2; Planck generalized radiation law; local inhomogeneity; local open circuit voltage; local splitting; local threshold energy; optical absorption; optical band gap energy; opto-electronic property; quasiFermi levels; spatial variations; spectrally resolved confocal photoluminescence; thin film solar cells; Absorption; Circuits; Data analysis; Energy resolution; Optical films; Optical recording; Photoluminescence; Photovoltaic cells; Spatial resolution; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411150
  • Filename
    5411150