Title :
Ga distribution and adhesion issues in selenization of metallic Cu-Ga-In precursors
Author :
Kim, Woo Kyoung ; Hanket, Gregory M. ; Shafarman, William N.
Author_Institution :
Inst. of Energy Conversion, Univ. of Delaware, Newark, DE, USA
Abstract :
A Three-step selenization process consisting of H2Se/Ar/H2Se reaction was employed to mitigate adhesion and Ga homogeneity problems in the formation of Cu(InGa)Se2 films. In particular, reaction conditions for the 3rd step have been experimentally optimized to address these issues. The Cu(InGa)Se2 films prepared by three-step selenization using H2Se/Ar/H2Se sequentially at 400/550/500°C with the reaction times of 30/20/(20-30) min had good adhesion to Mo and survived the chemical bath deposition of CdS. Additionally, EDS, XRD and AES analyses show significantly improved Ga homogeneity through the depth of the film. However, AES results indicate Ga depletion near the surface where it matters, also evidenced by low VOC in J-V plot.
Keywords :
Auger electron spectra; X-ray chemical analysis; X-ray diffraction; adhesion; copper compounds; gallium compounds; indium compounds; liquid phase deposition; semiconductor growth; semiconductor thin films; ternary semiconductors; AES; CuInGaSe2; EDS; XRD; adhesion; chemical bath deposition; films; homogeneity; temperature 400 degC; temperature 500 degC; temperature 550 degC; thermal annealing; three-step selenization; Adhesives; Annealing; Argon; Displays; Energy conversion; Glass; Inductors; Spectroscopy; Substrates; X-ray scattering;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2009.5411155