DocumentCode :
3438859
Title :
Microscopy Study of Fretting Corrosion of Tin Plated Contacts
Author :
Ito, Takao ; Hattori, Yoshiyuki ; Iida, Kazumasa ; Saitoh, Youichi
Author_Institution :
AutoNetworks Technol., Ltd., Suzuka
fYear :
2007
fDate :
16-19 Sept. 2007
Firstpage :
216
Lastpage :
221
Abstract :
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in cars for the comfort of the passengers. In this report, we made fretting test samples of connectors for which contact resistance had increased and analyzed the cross-section of the contact points using scanning electron microscopy (SEM) and transmission electron microscopy (TEM) and micro hardness measurement. Based on the observation and measurement results, we considered the change of the contact microstructure for various fretting cycles.
Keywords :
contact resistance; electric connectors; electrical contacts; microhardness; scanning electron microscopy; tin; transmission electron microscopy; wear testing; SEM; Sn; TEM; connectors; contact microstructure; contact points; contact resistance; fretting corrosion; micro hardness measurement; scanning electron microscopy; tin plated contacts; transmission electron microscopy; Automobiles; Connectors; Contacts; Corrosion; Electrical resistance measurement; Electronic equipment; Scanning electron microscopy; Tin; Transmission electron microscopy; Wiring; Fretting; hardness; microstructure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical contacts - 2007, the 53rd ieee holm conference on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
1-4244-0837-7
Electronic_ISBN :
1-4244-0838-5
Type :
conf
DOI :
10.1109/HOLM.2007.4318220
Filename :
4318220
Link To Document :
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