Title :
Built-in self test architectures for multistage interconnection networks
Author :
Bernard, E. ; Simon, S. ; Nossek, J.A.
Author_Institution :
OEN TN ETD3, Siemens AG, Munich, Germany
Abstract :
A novel built-in self test architecture for locally controlled cube-type N×N multistage interconnection networks (MINs) is presented. First, a state-based pseudoexhaustive test procedure for this class of MINs is outlined. Then, a labelling algorithm on a binary n-cube is described which generates the necessary inputs for the tests. From the dependence graph of this algorithm a tree architecture is derived which results in a hardware overhead of O(1/log N)
Keywords :
built-in self test; hypercube networks; multistage interconnection networks; trees (mathematics); binary n-cube; built-in self testing; dependence graph; hardware overhead; labelling algorithm; locally controlled MIN; multistage interconnection network; state-based pseudoexhaustive test; tree architecture; Automatic testing; Built-in self-test; Circuit testing; Fault detection; Hardware; Labeling; Multiprocessor interconnection networks; Routing; System testing; Tree graphs;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494145
