DocumentCode :
3439022
Title :
The Influence of the Wetting Layer Morphology on the Nucleation and the Evolution of InAs/GaAs (001) Quantum Dots
Author :
Bute, O. ; Cimpoca, Gh V. ; Placidi, E. ; Arciprete, F. ; Patella, F. ; Fanfoni, M. ; Balzarotti, A.
Author_Institution :
Dept. of Phys., Valahia Univ. of Targoviste, Targoviste
Volume :
2
fYear :
2007
fDate :
Oct. 15 2007-Sept. 17 2007
Firstpage :
337
Lastpage :
340
Abstract :
We present an impression of the present state of knowledge on the formation, via a modified Stransky-Krastanov growth mode, of InAs quantum dots (QD) on GaAs substrates. In order to fulfil this requirement, we have grown by MBE a single sample with gradient coverage and its analyses being performed by means of atomic force microscopy.
Keywords :
III-V semiconductors; atomic force microscopy; gallium arsenide; indium compounds; molecular beam epitaxial growth; nucleation; semiconductor epitaxial layers; semiconductor growth; semiconductor quantum dots; surface morphology; wetting; InAs-GaAs; InAs-GaAs (001) quantum dots; MBE growth; atomic force microscopy; modified Stransky-Krastanov growth mode; nucleation; wetting layer morphology; Alloying; Atomic force microscopy; Atomic layer deposition; Capacitive sensors; Diffraction; Gallium arsenide; Molecular beam epitaxial growth; Quantum dots; Substrates; Surface morphology; Nanomaterials; Quantum Dots; Self assembling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2007. CAS 2007. International
Conference_Location :
Sinaia
ISSN :
1545-827X
Print_ISBN :
978-1-4244-0847-4
Type :
conf
DOI :
10.1109/SMICND.2007.4519729
Filename :
4519729
Link To Document :
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