DocumentCode
343910
Title
Cylindrical 3D PML-PLRC-FDTD schemes for frequency-dispersive and inhomogeneous media
Author
Teixeira, F.L. ; Chew, W.C.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume
2
fYear
1999
fDate
11-16 July 1999
Firstpage
1304
Abstract
We present three-dimensional (3D) finite-difference time-domain (FDTD) schemes for transient simulation of electromagnetic wave propagation in complex (inhomogeneous and frequency-dispersive media with conductive loss) media and cylindrical coordinates. The proposed cylindrical FDTD scheme incorporates an extension of the perfectly matched layer (PML) absorbing boundary condition (ABC) to 3D cylindrical coordinates coupled to the piecewise-linear recursive convolution (PLRC) algorithm for dispersive media, accounting for both Lorentz and Debye multi-species frequency-dispersive models. Both split-field and unsplit (anisotropic medium) formulations of the cylindrical PML-PLRC-FDTD scheme are implemented and compared.
Keywords
anisotropic media; conducting bodies; convolution; dispersive media; electromagnetic wave absorption; electromagnetic wave propagation; finite difference time-domain analysis; losses; piecewise linear techniques; transient analysis; 3D cylindrical coordinates; 3D finite-difference time-domain; absorbing boundary condition; conductive loss; conductive media; cylindrical 3D PML-PLRC-FDTD; electromagnetic wave propagation; frequency-dispersive media; inhomogeneous media; multi-species frequency-dispersive models; perfectly matched layer; piecewise-linear recursive convolution algorithm; split-field formulation; transient simulation; unsplit-field formulation; Boundary conditions; Electromagnetic propagation; Electromagnetic transients; Finite difference methods; Frequency; Nonhomogeneous media; Perfectly matched layers; Piecewise linear techniques; Propagation losses; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location
Orlando, FL, USA
Print_ISBN
0-7803-5639-x
Type
conf
DOI
10.1109/APS.1999.789553
Filename
789553
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