DocumentCode :
3439133
Title :
Self-evolving, advanced test stand reasoning for closed loop diagnostics
Author :
Kalgren, Patrick W. ; Byington, Carl S.
Author_Institution :
Impact Technol., LLC, State College, PA, USA
fYear :
2005
fDate :
26-29 Sept. 2005
Firstpage :
495
Lastpage :
501
Abstract :
Advanced test stand reasoning can yield dramatically increased Line Replaceable Unit (LRU) operational availability through reduction of Mean Time to Repair (MTTR) while offering better utilization of related maintenance and test equipment resources. However, technical challenges related to development of reasoning systems, typically requiring expert LRU domain knowledge, present hurdles that can be prohibitive. Reasoning methods developed using simple pattern recognition and repair instance statistics offer a first order approach that is functional from a proof of concept perspective. Unfortunately, the small numbers of statistics available historically provide reduced reasoner reliability and effectiveness when confronted with dynamic and complex avionic systems. This paper discusses the issues, trade-offs, and potential benefits to be gained through the application of robust, self-evolving, hybrid reasoning techniques. A reasoner that can utilize and leverage the constraints found in typical test stand procedures to provide a best, safe path to diagnosis, while learning and optimizing in-situ, may offer an ideal, scaleable solution for optimizing test stand operations. Related information management and diagnostic model visualization techniques are also presented in the context of diagnostic and avionic system evaluation and improvement.
Keywords :
closed loop systems; diagnostic expert systems; inference mechanisms; advanced test stand reasoning; closed loop diagnostic; hybrid reasoning technique; potential benefits; self-evolving reasoning; trade-offs; Aerospace electronics; Automatic testing; Availability; Constraint optimization; Context modeling; Information management; Pattern recognition; Robustness; Statistics; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2005. IEEE
Print_ISBN :
0-7803-9101-2
Type :
conf
DOI :
10.1109/AUTEST.2005.1609187
Filename :
1609187
Link To Document :
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