DocumentCode
3439135
Title
Automatic test generation for maximal diagnosis of linear analog circuits
Author
Mir, S. ; Lubaszewski, M. ; Kolarik, V. ; Courtois, B.
Author_Institution
TIMA, Grenoble, France
fYear
1996
fDate
11-14 Mar 1996
Firstpage
254
Lastpage
258
Abstract
A fault-based multifrequency test generation and fault diagnosis procedure is proposed in this work. The procedure selects a minimal set of test measures and generates the minimal set of frequency tests which guarantee maximum fault coverage and maximal diagnosis of circuit AC hard/soft faults. The procedure is exemplified for several self-testable linear analog circuits
Keywords
analogue circuits; automatic testing; circuit testing; fault diagnosis; linear network analysis; AC circuits; automatic test generation; fault diagnosis; hard faults; linear analog circuits; maximal diagnosis; multifrequency test generation; self-testing; soft faults; AC generators; Analog circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Fault diagnosis; Frequency measurement; Nonlinear equations;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location
Paris
ISSN
1066-1409
Print_ISBN
0-8186-7424-5
Type
conf
DOI
10.1109/EDTC.1996.494157
Filename
494157
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