Title :
A new model to assess the reliability of CPV modules in real time outdoor tests
Author :
González, J.R. ; Vázquez, M. ; Algora, C. ; Nunez, N.
Author_Institution :
Inst. de Energia Solar, Univ. Politec. de Madrid, Madrid, Spain
Abstract :
The reliability of CPV systems is a hot question considering that they must compete with silicon flat modules, which in turn have been demonstrated to be capable of withstand 25 years in field operation. In this paper, a summary of the IES-UPM achievements in this field is presented. A new method for assessing the reliability of CPV systems in real operation is needed and a first approach is presented. INTA-SPASOLAB is also getting involved in this subject and a new testing field has been installed.
Keywords :
elemental semiconductors; photovoltaic power systems; power system reliability; power system simulation; silicon; IES-UPM; INTA-SPASOLAB; Si; concentrator photovoltaic systems reliability; real time outdoor tests; silicon flat modules; Accelerated aging; Failure analysis; Life estimation; Photovoltaic cells; Photovoltaic systems; Silicon; Solar power generation; Stress; System testing; Warranties;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2009.5411168
