Title :
Evaluation of iDD/vOUT cross-correlation for mixed current-voltage testing of analogue and mixed-signal circuits
Author :
da Silva, J. Machado ; Matos, J. Silva
Author_Institution :
Fac. de Engenharia da Univ. do Porto, INESC, Porto, Portugal
Abstract :
The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current/voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and built-in self test techniques
Keywords :
analogue circuits; built-in self test; circuit testing; correlation methods; design for testability; dynamic response; mixed analogue-digital integrated circuits; analogue circuits; built-in self test; cross-correlation; design for testability; dynamic response; fault coverage; mixed current-voltage testing; mixed-signal circuits; output voltage; power supply current; simulation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Digital signal processing; Electrical fault detection; Probability; Registers; Voltage control;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494159
