Title :
Methods and tools for characterisation of semiconductor device models
Author :
Konczykowska, Agnieszka ; Zuberek, Wlodek M.
Author_Institution :
France Telecom, CNET, Bagneux, France
Abstract :
Rapid developments in semiconductor technologies create new needs for devices characterisation and modelling methods. In this paper we present a characterisation and modelling methodology which provides accurate device models for computer-aided design and necessary feedback for technology process analysis. Predictive modelling tools and different extraction approaches are presented. The impact of symbolic simulation on the extraction methods is discussed
Keywords :
digital simulation; electronic engineering computing; semiconductor device models; symbol manipulation; CAD; computer-aided design; model characterisation; modelling methods; parameter extraction approaches; predictive modelling tools; semiconductor device models; symbolic simulation; technology process analysis; CMOS technology; Circuit simulation; Circuit synthesis; Computational modeling; Data mining; Design automation; Heterojunction bipolar transistors; Integrated circuit interconnections; Predictive models; Semiconductor device modeling;
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
DOI :
10.1109/ICECS.1998.813941
