• DocumentCode
    3439377
  • Title

    Cracking mechanisms in Ag-SnO2 contact materials and their role in the erosion process

  • Author

    Kan, Shinhoo ; Brecher, Charles

  • Author_Institution
    GTE Lab. Inc., Waltham, MA, USA
  • fYear
    1988
  • fDate
    26-29 Sept. 1988
  • Firstpage
    37
  • Lastpage
    46
  • Abstract
    The authors present the results of an investigation conducted into the factors governing the erosion of Ag-SnO/sub 2/ electric contact materials by repeated electric arcing and the manner in which these factors are altered by chemical effects. Two features found to have major influences were the inhomogeneous interfaces between the Ag matrix and the SnO/sub 2/ granules, and the wetting characteristics of the surface. The Ag/SnO/sub 2/ interfaces, which serve as paths for crack propagation, appear to have dominant influence during the earlier stages of erosion, while the extent of surface wetting by molten silver, which was found capable of altering the stress intensity at the crack tip, predominates in the later stages. The effect of dopant additives in altering the surface activity was also examined.<>
  • Keywords
    composite materials; cracks; electrical contacts; environmental testing; materials testing; silver alloys; tin compounds; wear; Ag matrix; Ag-SnO/sub 2/ contact materials; SnO/sub 2/ granules; chemical effects; contact erosion; crack propagation; crack tip; cracking mechanism; dopant additives; electric contact materials; erosion process; inhomogeneous interfaces; molten Ag wetting; repeated electric arcing; stress intensity; surface activity; surface wetting; wetting characteristics; Contactors; Dispersion; Electric shock; Performance evaluation; Reactive power; Scanning electron microscopy; Silver; Temperature; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/HOLM.1988.16092
  • Filename
    16092