Research on accelerated electrical stress test for electronic product

This paper describes an accelerated test method for power on/off cycling effect on electronic products. Power on/off cycling impact the reliability of electronic equipment has become a research focus in the past several years. Early research mainly focused on the tubes, and later extended to the solid state devices, most of the current study focused on the internal damage impacted by power on/off cycling of transistors and integrated circuits, but little literature to consider the test over the module level and reliability analysis research. Based on the above consideration, this paper takes functional unit of certain radar as test research subjects, and put forward the power on/off cycling test method and comparative analysis through three group tests.