Title :
Switch-level fault simulation for non-trivial faults based on abstract data types
Author :
Meyer, Wolfgang ; Vierhaus, H.T.
Abstract :
FEHSIM, a switch-level fault simulator, is introduced. It is able to handle stuck-on and stuck-open CMOS faults as well as local bridging faults through novel concepts of internal fault propagation and network analysis. Transistor widths and lengths are taken into account to give a `hard´ detection of stuck-on faults. The switch-level model seems to strike a reasonable balance between a detailed electrical model and a simplified and abstract logical model
Keywords :
CMOS integrated circuits; circuit analysis computing; failure analysis; logic CAD; CMOS IC; FEHSIM; abstract data types; internal fault propagation; local bridging faults; network analysis; nontrivial faults; stuck-on faults; stuck-open faults; switch-level fault simulator; transistor lengths; transistor widths; Analytical models; CMOS logic circuits; Circuit faults; Circuit simulation; MOS devices; Semiconductor device modeling; Switching circuits; Testing; Variable structure systems; Wire;
Conference_Titel :
CompEuro '91. Advanced Computer Technology, Reliable Systems and Applications. 5th Annual European Computer Conference. Proceedings.
Conference_Location :
Bologna
Print_ISBN :
0-8186-2141-9
DOI :
10.1109/CMPEUR.1991.257388
