• DocumentCode
    3439603
  • Title

    Thermal and spectroscopic characterization of quantum dot-enhanced solar cells

  • Author

    Gardner, J. ; Albers, E. ; Bailey, C.G. ; Hubbard, S. ; Raffaelle, R.

  • Author_Institution
    NanoPower Res. Labs., Rochester Inst. of Technol., Rochester, NY, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    Three characterization methods are discussed for InAs/GaAs quantum dot (QD)-enhanced GaAs solar cells. Photoreflectance (PR) and electroluminescence (EL) measurements yield seven QD-related transitions between 1.1 and 1.4 eV. The PR feature attributed to bulk GaAs at 1.42 eV is analyzed to extract an electric field strength in the solar cell depletion region of 43 ± 1 kV/cm2. Temperature coefficients are measured for open-circuit voltage and short-circuit current under AM1.5D illumination from devices with zero, five, and 20 layers of QDs, and improved temperature stability is observed in the QD-enhanced devices. Lastly, the saturation current activation energy for two samples is extracted, and the results are presented as evidence of bandgap tuning.
  • Keywords
    electroluminescence; gallium arsenide; photoreflectance; semiconductor quantum dots; solar cells; AM1.5D illumination; InAs-GaAs; QD-enhanced devices; QD-related transitions; bandgap tuning; depletion region; electric field strength; electroluminescence measurements; electron volt energy 1.1 eV to 1.4 eV; electron volt energy 1.42 eV; open-circuit voltage; photoreflectance measurements; quantum dot-enhanced solar cells; saturation current activation energy; short-circuit current; spectroscopic characterization; temperature coefficients; temperature stability; thermal characterization; Current measurement; Electroluminescence; Gallium arsenide; Lighting; Photovoltaic cells; Quantum dots; Spectroscopy; Stability; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411190
  • Filename
    5411190