DocumentCode :
3439632
Title :
User-centric digital test architecture
Author :
Jones, Chris ; McGoldrick, Mike
Author_Institution :
Assembly Test Div., Teradyne, Inc., North Reading, MA
fYear :
2005
fDate :
26-29 Sept. 2005
Firstpage :
666
Lastpage :
673
Abstract :
This paper describes a combination of digital test instrument features that improve productivity and performance of digital tests by supporting their specification from the UUT´s data sheet. Adaptive hardware features that allow this include: flexible timing, dynamic instrument reconfiguration, automatic handshaking, data compression, serial and asynchronous event handling, and hardware subroutines. These architectural features give the test engineer more flexibility, make test writing more efficient, and offer the possibility of more test coverage and analysis. The proposed modular design approach allows for more configurable and cost-efficient systems
Keywords :
automatic test equipment; digital instrumentation; integrated circuit testing; logic testing; asynchronous event handling; automatic handshaking; data compression; digital test instrument; dynamic instrument reconfiguration; hardware subroutines; serial event handling; user-centric digital test architecture; Algorithms; Assembly; Circuit testing; Electronic equipment testing; Hardware; Instruments; Logic; Programming profession; Protocols; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2005. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9101-2
Type :
conf
DOI :
10.1109/AUTEST.2005.1609214
Filename :
1609214
Link To Document :
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