DocumentCode :
3439641
Title :
Total dose irradiation effects in the μA741 operational amplifier with different biases
Author :
Jian-Bo Liu ; Yuan Liu ; Jin-Li Cheng ; Yun-fei En ; Ting Zhang ; Yu-Juan He ; Fu-Yao Dong
Author_Institution :
Sch. of Mater. & Energy, Guangdong Univ. of Technol., Guangzhou, China
fYear :
2013
fDate :
15-18 July 2013
Firstpage :
1156
Lastpage :
1159
Abstract :
Total dose dependence of bias current and offset voltage in the linear operational amplifier μA741 with different bias is presented in this paper. The experimental results show that the bias current in the μA741 with grounded bias is significantly affected by the degradation of the differential input transistors. In addition, the offset voltage is affected by the degradation of bipolar transistors of the current source in the differential input stage.
Keywords :
bipolar transistors; operational amplifiers; radiation effects; bias current; bipolar transistors; grounded bias; linear operational amplifier; offset voltage; total dose irradiation effects; Bipolar transistors; Degradation; Educational institutions; Junctions; Operational amplifiers; Radiation effects; Transistors; bias current; bipolar transistor; offset voltage; operational amplifier; total dose;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
Type :
conf
DOI :
10.1109/QR2MSE.2013.6625772
Filename :
6625772
Link To Document :
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