• DocumentCode
    3440015
  • Title

    Noise in CMOS LDOs

  • Author

    Profirescu, Ovidiu ; Dinca, Cristi ; Stanescu, Cornel

  • Author_Institution
    Centre of Excellence, EDIL Microelectron. R&D, Bucharest
  • Volume
    2
  • fYear
    2007
  • fDate
    Oct. 15 2007-Sept. 17 2007
  • Firstpage
    563
  • Lastpage
    566
  • Abstract
    The paper presents the main noise sources in CMOS low dropout linear voltage regulators (LDOs), their simulation and measurement. The paper is focused on noise performance, which is of great importance for the design of CMOS circuits.
  • Keywords
    CMOS analogue integrated circuits; semiconductor device measurement; semiconductor device models; semiconductor device noise; voltage regulators; CMOS LDOS; CMOS circuits design; low dropout linear voltage regulators; CMOS process; Capacitors; Circuit noise; Frequency; Low voltage; Photonic band gap; Regulators; Resistors; Semiconductor device noise; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2007. CAS 2007. International
  • Conference_Location
    Sinaia
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4244-0847-4
  • Type

    conf

  • DOI
    10.1109/SMICND.2007.4519786
  • Filename
    4519786
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3440015