DocumentCode
3440082
Title
Development of a new interchangeable virtual instrument class specification
Author
Kennedy, Cathleen
Author_Institution
Syst. & Electron. Inc, St. Louis, MO
fYear
2005
fDate
26-29 Sept. 2005
Firstpage
812
Lastpage
819
Abstract
In today\´s world, rapidly changing technology and high costs associated with developing and maintaining ATE software push the need for reusability and ease of upgrading or replacing components in test systems intended to be used over a long period of time. The interchangeable virtual instrument (IVI) foundation is tackling these issues by: "Promoting specifications for programming test instruments that simplify interchangeability, provide better performance, and reduce program development and maintenance cost". An interchangeable virtual instrument (IVI) class specification defines the base capabilities and extensions for an instrument type (such as a function generator or oscilloscope). This specification defines the application programming interface (API) used to develop an IVI class-compliant driver. Systems & Electronics Inc. and Boeing are jointly chairing an IVI foundation working group to define an IVI class specification for a counter/timer. Based on the experiences of characterizing the counter/timer specification, this paper explores the process of creating a new class specification for an instrument type that does not already have a specification defined. Topics such as steps to effective specification development, obstacles encountered, and how to keep the specification moving forward are discussed
Keywords
application program interfaces; automatic test equipment; virtual instrumentation; ATE software; IVI class-compliant driver; IVI foundation; application programming interface; class specification; counter/timer specification; interchangeable virtual instrument; program development; programming test instruments; Costs; Counting circuits; Driver circuits; Instruments; Oscilloscopes; Signal generators; Software maintenance; Software reusability; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2005. IEEE
Conference_Location
Orlando, FL
Print_ISBN
0-7803-9101-2
Type
conf
DOI
10.1109/AUTEST.2005.1609237
Filename
1609237
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