Title :
High efficiency solar cells based on AlInGaP
Author :
Campesato, R. ; Casale, M. ; Gori, G. ; Gabetta, G. ; Colletto, R. ; Taylor, S.
Author_Institution :
CESI SpA, Milan, Italy
Abstract :
Aim of this work, is the study of the properties of Aluminium Gallium Indium Phosphide for the realization of the next generation high-efficiency multi-junction (MJ) solar cells. (AlxGa1-x)0.50In0.50P (AlInGaP) is a semiconductor with a high direct bandgap that can be tuned between 1.81 eV and 2.00 eV varying the Al content in the range 0<x¿0.12. This makes AlInGaP one of the most promising candidates for the manufacture of the top junction layers in multi-junction solar cells. In a five junction structure AlInGaP/InGaP/AlInGaAs/InGaAs/Ge, the use of AlInGaP with high Al content may lead to solar cells with maximum theoretical efficiencies above 40% in AM0 conditions. In this paper, we report the results of the material characterization we have carried out on AlInGaP single junction (SJ) solar cells grown by MOCVD, highlighting its electrical and optical behaviour as a function of the Aluminium content. The best performing cell we have obtained so far showed an open circuit voltage of 1.473 V, and a short circuit current of 15 mA/cm2.
Keywords :
III-V semiconductors; aluminium compounds; dark conductivity; energy gap; gallium compounds; indium compounds; photoluminescence; semiconductor junctions; semiconductor thin films; short-circuit currents; solar cells; thin film devices; (AlxGa1-x)0.50In0.50P; MOCVD; bandgap; capacitance-voltage measurements; dark current; electrical behaviour; high-efficiency multi-junction solar cells; open circuit voltage; optical behaviour; photoluminescence spectral response; semiconductor; short circuit current; single junction solar cells; Aluminum; Gallium compounds; III-V semiconductor materials; Indium gallium arsenide; Indium phosphide; MOCVD; Optical materials; Photonic band gap; Photovoltaic cells; Semiconductor device manufacture;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2009.5411214