DocumentCode :
3440451
Title :
Microstructural and mechanical characterisation of Al back contact layers and its application to thermomechanical mulitscale modeling of solar cells
Author :
Popovich, V.A. ; van Amstel, T. ; Bennett, I.J. ; Janssen, M. ; Richardson, I.M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Delft Univ. of Technol., Delft, Netherlands
fYear :
2009
fDate :
7-12 June 2009
Abstract :
The overall demand to reduce solar energy costs gives a continuous drive to reduce the thickness of silicon wafers. Handling and bowing problems associated with thinner wafers become more and more important, as these can lead to cells cracking and high yield losses. In this paper a discussion of the microstructure and mechanical properties of the aluminium on the rear side of a solar cell is presented. It will be shown that the aluminium back contact has a complex composite-like microstructure, consisting of five main components: 1) the back surface field layer 2) a eutectic layer 3) spherical (3 - 5 ¿m) hypereutectic Al-Si particles, surrounded by a thin aluminum oxide layer (200 nm); 4) a bismuth-silicate glass matrix; 5) pores (15 vol.%). The Young´s modulus of the Al-Si particles is estimated by nanoindentation. These results are used as input parameters for an improved thermomechanical multiscale model of a silicon solar cell.
Keywords :
Young´s modulus; aluminium compounds; bismuth compounds; crystal microstructure; glass; silicon compounds; solar cells; Al back contact layers; Al2O3; AlSi; Bi2O3-SiO2; Young´s modulus; back surface field layer; bismuth-silicate glass matrix; cells cracking; complex composite like microstructure; eutectic layer; mechanical properties; silicon solar cell; silicon wafers; solar energy; spherical hypereutectic particles; thermomechanical multiscale modeling; thin aluminum oxide layer; yield losses; Aluminum oxide; Costs; Glass; Mechanical factors; Microstructure; Photovoltaic cells; Semiconductor device modeling; Silicon; Solar energy; Thermomechanical processes; Al back contact; Multiscale model; Young´s modulus; microstructure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2009.5411231
Filename :
5411231
Link To Document :
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