• DocumentCode
    3440451
  • Title

    Microstructural and mechanical characterisation of Al back contact layers and its application to thermomechanical mulitscale modeling of solar cells

  • Author

    Popovich, V.A. ; van Amstel, T. ; Bennett, I.J. ; Janssen, M. ; Richardson, I.M.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    The overall demand to reduce solar energy costs gives a continuous drive to reduce the thickness of silicon wafers. Handling and bowing problems associated with thinner wafers become more and more important, as these can lead to cells cracking and high yield losses. In this paper a discussion of the microstructure and mechanical properties of the aluminium on the rear side of a solar cell is presented. It will be shown that the aluminium back contact has a complex composite-like microstructure, consisting of five main components: 1) the back surface field layer 2) a eutectic layer 3) spherical (3 - 5 ¿m) hypereutectic Al-Si particles, surrounded by a thin aluminum oxide layer (200 nm); 4) a bismuth-silicate glass matrix; 5) pores (15 vol.%). The Young´s modulus of the Al-Si particles is estimated by nanoindentation. These results are used as input parameters for an improved thermomechanical multiscale model of a silicon solar cell.
  • Keywords
    Young´s modulus; aluminium compounds; bismuth compounds; crystal microstructure; glass; silicon compounds; solar cells; Al back contact layers; Al2O3; AlSi; Bi2O3-SiO2; Young´s modulus; back surface field layer; bismuth-silicate glass matrix; cells cracking; complex composite like microstructure; eutectic layer; mechanical properties; silicon solar cell; silicon wafers; solar energy; spherical hypereutectic particles; thermomechanical multiscale modeling; thin aluminum oxide layer; yield losses; Aluminum oxide; Costs; Glass; Mechanical factors; Microstructure; Photovoltaic cells; Semiconductor device modeling; Silicon; Solar energy; Thermomechanical processes; Al back contact; Multiscale model; Young´s modulus; microstructure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411231
  • Filename
    5411231