DocumentCode
3440451
Title
Microstructural and mechanical characterisation of Al back contact layers and its application to thermomechanical mulitscale modeling of solar cells
Author
Popovich, V.A. ; van Amstel, T. ; Bennett, I.J. ; Janssen, M. ; Richardson, I.M.
Author_Institution
Dept. of Mater. Sci. & Eng., Delft Univ. of Technol., Delft, Netherlands
fYear
2009
fDate
7-12 June 2009
Abstract
The overall demand to reduce solar energy costs gives a continuous drive to reduce the thickness of silicon wafers. Handling and bowing problems associated with thinner wafers become more and more important, as these can lead to cells cracking and high yield losses. In this paper a discussion of the microstructure and mechanical properties of the aluminium on the rear side of a solar cell is presented. It will be shown that the aluminium back contact has a complex composite-like microstructure, consisting of five main components: 1) the back surface field layer 2) a eutectic layer 3) spherical (3 - 5 ¿m) hypereutectic Al-Si particles, surrounded by a thin aluminum oxide layer (200 nm); 4) a bismuth-silicate glass matrix; 5) pores (15 vol.%). The Young´s modulus of the Al-Si particles is estimated by nanoindentation. These results are used as input parameters for an improved thermomechanical multiscale model of a silicon solar cell.
Keywords
Young´s modulus; aluminium compounds; bismuth compounds; crystal microstructure; glass; silicon compounds; solar cells; Al back contact layers; Al2O3; AlSi; Bi2O3-SiO2; Young´s modulus; back surface field layer; bismuth-silicate glass matrix; cells cracking; complex composite like microstructure; eutectic layer; mechanical properties; silicon solar cell; silicon wafers; solar energy; spherical hypereutectic particles; thermomechanical multiscale modeling; thin aluminum oxide layer; yield losses; Aluminum oxide; Costs; Glass; Mechanical factors; Microstructure; Photovoltaic cells; Semiconductor device modeling; Silicon; Solar energy; Thermomechanical processes; Al back contact; Multiscale model; Young´s modulus; microstructure;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location
Philadelphia, PA
ISSN
0160-8371
Print_ISBN
978-1-4244-2949-3
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2009.5411231
Filename
5411231
Link To Document