Determination of parameters of some materials for millimeter waves using multifrequency measuring of reflection characteristics

One of problems of applied radiophysics is the necessity of measuring (checking) of parameters of layered structures by non-contact methods. The developed investigations have shown an opportunity of solution of the given problem on the basis of radiowave multifrequency measuring of reflection from the explored structures. The approach to determination of parameters of some industrial materials and liquids using multifrequency measurement at millimeter wave frequencies have been considered