Title :
Weighted pseudorandom generation for built-in self-test
Author :
Favalli, M. ; Ercolani, S. ; Dalpasso, M. ; Olivo, P. ; Riccò, B.
Author_Institution :
DEIS, Bologna Univ., Italy
Abstract :
A novel method to obtain weights for weighted pseudorandom built-in self-test (BIST) techniques that can be used to solve the fault coverage problems posed by hard-to-detect faults is presented. In the method, weights are directly obtained by means of the stuck-at fault simulation instead of using testability measures. In this way, a single set of weights is obtained that is more conveniently implemented than the multiple distributions provided by alternative techniques. Results obtained on benchmark circuits show a large increase of the achieved fault coverage values compared with the case of uniformly biased pseudorandom sequences
Keywords :
built-in self test; circuit analysis computing; failure analysis; integrated circuit testing; random number generation; benchmark circuits; fault coverage; stuck-at fault simulation; weighted pseudorandom built-in self-test; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Probability distribution; Random sequences;
Conference_Titel :
CompEuro '91. Advanced Computer Technology, Reliable Systems and Applications. 5th Annual European Computer Conference. Proceedings.
Conference_Location :
Bologna
Print_ISBN :
0-8186-2141-9
DOI :
10.1109/CMPEUR.1991.257451
