Title :
A Design of the Temperature Test System Based on Grouping DS18B20
Author :
Ping, LI ; Yucai, Zhou ; Zeng, Xiangjun ; Ting-Fang, Yang
Author_Institution :
Changsha Univ. of Sci. & Technol., Changsha
Abstract :
All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.
Keywords :
field buses; microcontrollers; temperature sensors; DS18B20 sensors; IO bus; MCU; temperature test system; Circuits; Power supplies; Read only memory; Sensor systems; Software measurement; Software testing; System testing; Temperature distribution; Temperature sensors; Velocity measurement; DS18B20 Group; temperature test; time spent on the alternate test;
Conference_Titel :
Industrial Electronics and Applications, 2007. ICIEA 2007. 2nd IEEE Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-0737-8
Electronic_ISBN :
978-1-4244-0737-8
DOI :
10.1109/ICIEA.2007.4318396
