3441126

Image segmentation of topographical obycts employing illumination parameter variations and correlation for quality control applications

Heger, T. ; Pandit, M.

Dept. of Electr. & Comput. Eng., Kaiserslautern Univ., Germany

2004

11-14 Dec. 2004

565

568

image recognition; image reconstruction; image segmentation; image sequences; machining; manufacturing processes; object recognition; surface topography; grey level variation; grinding surfaces; image fusion; image segmentation; image sequence; machining; manufacturing process; object 3-D topography; sequential reconstruction process; Application software; Azimuth; Control systems; Image analysis; Image segmentation; Layout; Lighting; Pixel; Quality control; Surface topography;

English

ieee

Signal Processing and Communications, 2004. SPCOM '04. 2004 International Conference on

0-7803-8674-4

conf

10.1109/SPCOM.2004.1458523

1458523