Title :
An approach to testability improvement of mixed-signal boards
Author :
Matos, Jose S. ; Ferreira, Joao C. ; Leao, Ana C. ; Silva, Jose M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Porto Univ., Portugal
fDate :
30 May-2 Jun 1994
Abstract :
The increasing complexity of mixed-signal boards makes an integrated analogue/digital testability approach an attractive proposition. This paper investigates one such approach based on the use of mixed-signal test support ICs together with standard board level test infrastructures. The architecture of a test support IC and preliminary experimental results are also presented
Keywords :
automatic testing; boundary scan testing; built-in self test; circuit testing; design for testability; integrated circuit testing; printed circuit testing; integrated analogue/digital testability approach; mixed-signal boards; standard board level test infrastructures; test support ICs; testability improvement; Automatic testing; Binary search trees; Circuit testing; Consumer electronics; Industrial electronics; Integrated circuit testing; Life testing; Pins; Standards Board; Wires;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409551
