• DocumentCode
    3441219
  • Title

    An efficient algorithm for signal flow determination in digital CMOS VLSI

  • Author

    Baba-ali, A.R. ; Farah, A.

  • Author_Institution
    CDTA/Microelectron. Lab., Algiers, Algeria
  • fYear
    1996
  • fDate
    11-14 Mar 1996
  • Firstpage
    288
  • Lastpage
    293
  • Abstract
    Signal flow determination of CMOS/VLSI digital circuits is a key issue for switch-level CAD tools such as timing and testability analyzers, or functional abstractors, ATPGs etc. and even some simulators. It is used to preprocess circuit MOS transistors in order to improve both the accuracy and the running time of these CAD tools. Existing algorithms can be classified into two main categories: the rule based approach and the algorithmic approach. However, both of them have several drawbacks. This paper presents an efficient algorithm based on a novel mixed algorithmic and rule based approach, that overcomes most of the drawbacks of the pure algorithmic and rule based approaches. It is based on a set of “safe” general topological rules rather than ad hoc or technology dependent ones. Due to the algorithmic aspect of our approach, some rules consider circuit global effects such as path informations. Our approach provides the advantages of the rule based one (i.e.: the flexibility and the adaptability toward the great variety of CMOS design styles) as well as the advantages of the algorithmic approach (i.e.: the fast processing time and the ability to consider circuit global effects). The result is that the software is very accurate since all the unidirectional and bidirectional transistors are correctly identified in all the pathological benchmarks reported in the literature. Besides, the software is fast (about 50000 transistors/second) with a linear processing time
  • Keywords
    CMOS digital integrated circuits; VLSI; circuit CAD; network topology; signal flow graphs; timing; bidirectional transistors; circuit global effects; digital CMOS VLSI; mixed algorithmic/rule based approach; pathological benchmarks; processing time; signal flow determination; switch-level CAD tools; topological rules; unidirectional transistors; Analytical models; CMOS digital integrated circuits; Circuit simulation; Circuit testing; Digital circuits; MOSFETs; Signal analysis; Switching circuits; Timing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1996. ED&TC 96. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1066-1409
  • Print_ISBN
    0-8186-7424-5
  • Type

    conf

  • DOI
    10.1109/EDTC.1996.494315
  • Filename
    494315