• DocumentCode
    3441237
  • Title

    Bounding switching activity in CMOS circuits using constraint resolution

  • Author

    Zejda, J. ; Cerny, E. ; Shenoy, S. ; Rumin, N.C.

  • Author_Institution
    Dept. d´´Inf. et de Recherche Oper., Montreal Univ., Que., Canada
  • fYear
    1996
  • fDate
    11-14 Mar 1996
  • Firstpage
    294
  • Lastpage
    301
  • Abstract
    This paper deals with the problem of estimating the average power consumption (per clock cycle) of CMOS digital circuits. A new pattern-independent method is proposed for computing an upper bound on the switching activity, and therefore the average power of a combinational circuit described at the gate level. The method is based on the propagation of abstract waveform sets, described down to the level of individual transitions. The view of a gate as a relation between input and output signals, described by forward and partial inverse functions, permits the determination of a tight upper bound on the power using a constraint resolution method based on waveform narrowing. A fully scalable, case analysis-based algorithm provides at any step an upper bound and, with enough resources (CPU time), it can continue up to the exact solution. The paper presents the theoretical background, a description of the implementation, and results on benchmark circuits
  • Keywords
    CMOS logic circuits; VLSI; circuit CAD; combinational circuits; constraint handling; integrated circuit design; logic CAD; timing; CMOS digital circuits; abstract waveform sets; average power consumption; benchmark circuits; case analysis-based algorithm; combinational circuit; constraint resolution method; inverse functions; pattern-independent method; switching activity; upper bound; waveform narrowing; Algorithm design and analysis; CMOS digital integrated circuits; Central Processing Unit; Clocks; Combinational circuits; Digital circuits; Energy consumption; Signal resolution; Switching circuits; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1996. ED&TC 96. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1066-1409
  • Print_ISBN
    0-8186-7424-5
  • Type

    conf

  • DOI
    10.1109/EDTC.1996.494316
  • Filename
    494316