Title :
A partitioning-based method to determine the uniqueness of the DC operating points of transistor circuits
Author :
Sarmiento-Reyes, A. ; Davidse, J. ; Kleihorst, E. ; van Roermund, A.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
fDate :
30 May-2 Jun 1994
Abstract :
A new method to determine the uniqueness of the DC solutions of a general class of transistor circuits is presented. It makes use of the topology of the circuit in order to achieve a systematical partitioning process which permits to identify which part of the circuit represents the cause of the nonuniqueness. As result of this partitioning process, a considerable reduction in the number of calculations has been achieved
Keywords :
network topology; nonlinear network analysis; transistor circuits; DC operating points; partitioning-based method; topology; transistor circuits; uniqueness determination; Art; Circuit testing; Circuit topology; Couplings; Diodes; Integrated circuit modeling; Resistors; Symmetric matrices; Transistors; Vectors;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409559
