DocumentCode
3441362
Title
Enhancement-mode GaN MIS-HEMTs for power supplies
Author
Imada, T. ; Kanamura, M. ; Kikkawa, T.
Author_Institution
FUJITSU Labs. Ltd., Atsugi, Japan
fYear
2010
fDate
21-24 June 2010
Firstpage
1027
Lastpage
1033
Abstract
In this paper, we present the current status of GaN-high electron mobility transistor (HEMT) for power-supply-applications. Advantages of GaN HEMT are summarized with discussing required characteristics applying for power supplies. Then, we introduce our Enhancement-mode (E-mode) GaN MIS-HEMT technology. We focused on realizing both normally-off operation and high current density with high breakdown voltage. Detailed results are discussed in this paper. In particular, we developed a unique device structure called triple layer cap structure. High current density with normally-off mode was successfully achieved, which is preferable for power-supply application. We also demonstrated high speed performance with low on-resistance.
Keywords
MIS devices; gallium compounds; high electron mobility transistors; power supply circuits; GaN; breakdown voltage; current density; enhancement-mode MIS-HEMT; high electron mobility transistor; normally-off operation; power supply applications; triple layer cap structure; Aluminum gallium nitride; Controllability; Current density; Electrons; Epitaxial growth; Gallium nitride; HEMTs; Power supplies; Silicon carbide; Surface resistance; ALD; Enhancement-mode; GaN; MIS-HEMT;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Conference (IPEC), 2010 International
Conference_Location
Sapporo
Print_ISBN
978-1-4244-5394-8
Type
conf
DOI
10.1109/IPEC.2010.5542039
Filename
5542039
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