Title :
PALACE: A parallel and hierarchical layout analyzer and circuit extractor
Author :
Scherber, E. ; Barke, E. ; Meier, W.
Author_Institution :
Dept. of Electr. Eng., Hannover Univ., Germany
Abstract :
Layout verification of VLSI circuits can be speeded up significantly by parallel execution. The approach described in this paper combines parallel and hierarchical verification of cells and cell areas using geometrical partitioning. In contrast to earlier approaches, design rule check and netlist extraction are performed in parallel without any functional restriction. This is accomplished by a new concept called multiple execution switching. Thus, industrial leading edge VLSI circuits can be handled. High speedups are obtained for large real-world layouts. A productive use is possible and will reduce time-to-market considerably
Keywords :
VLSI; circuit layout CAD; integrated circuit layout; parallel algorithms; PALACE; VLSI circuits; circuit extractor; design rule check; geometrical partitioning; hierarchical layout analyzer; layout verification; multiple execution switching; netlist extraction; parallel execution; Chip scale packaging; Circuit analysis; Complexity theory; Costs; Coupling circuits; Data mining; Investments; Time to market; Very large scale integration; Workstations;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494325